除(chu)雜PCB制程中若(ruo)出現(xian)雜質或(huo)殘銅，清潔處理不當后，將金屬鹽類殘留在板面上。一(yi)旦吸(xi)潮或(huo)分(fen)層吸(xi)濕，便(bian)會(hui)形成CAF問題。因(yin)(yin)此需(xu)調整參(can)數避免殘銅，同時改進清洗方(fang)法并充分(fen)清潔。評估CAF的(de)(de)(de)方(fang)法：離(li)子遷(qian)移(yi)評價通(tong)常(chang)使用(yong)梳(shu)型電(dian)(dian)(dian)(dian)路板為試(shi)料，將成對(dui)的(de)(de)(de)電(dian)(dian)(dian)(dian)極(ji)交錯連接(jie)成梳(shu)形圖案，在高(gao)溫高(gao)濕的(de)(de)(de)條件下給予(yu)一(yi)固定之(zhi)直流電(dian)(dian)(dian)(dian)壓(ya)，經過(guo)長時間之(zhi)測試(shi)，并觀(guan)(guan)察線路是(shi)否有瞬間短路之(zhi)現(xian)象。針對(dui)CAF引(yin)起的(de)(de)(de)失(shi)(shi)效現(xian)象，一(yi)般采用(yong)的(de)(de)(de)方(fang)法是(shi)逐(zhu)步縮(suo)小范圍的(de)(de)(de)方(fang)法；失(shi)(shi)效樣品先測試(shi)電(dian)(dian)(dian)(dian)阻(zu)》》用(yong)顯微鏡觀(guan)(guan)察，找出大概失(shi)(shi)效的(de)(de)(de)位(wei)置(zhi)》》退掉表面的(de)(de)(de)綠油(you)》》再觀(guan)(guan)察具體的(de)(de)(de)位(wei)置(zhi)》》磨切片觀(guan)(guan)察失(shi)(shi)效發生的(de)(de)(de)原因(yin)(yin)選(xuan)擇智能電(dian)(dian)(dian)(dian)阻(zu)時，用(yong)戶需(xu)要根(gen)據(ju)具體需(xu)求考慮精度、穩定性(xing)、接(jie)口(kou)等因(yin)(yin)素，以便(bian)選(xuan)擇適合(he)的(de)(de)(de)智能電(dian)(dian)(dian)(dian)阻(zu)產品。東(dong)莞離(li)子遷(qian)移(yi)電(dian)(dian)(dian)(dian)阻(zu)測試(shi)

5.1.硬件(jian)(jian)連接與(yu)(yu)操(cao)作步驟(zou)1)事先準備(bei)好(hao)要求測(ce)試(shi)的PCB樣品，接好(hao)測(ce)試(shi)線，插入相對應的航(hang)空(kong)座。2)把納伏表(biao)和(he)可編(bian)程電(dian)源(yuan)安(an)裝(zhuang)好(hao)，連接儀器(qi)與(yu)(yu)計(ji)算(suan)機通信線。3)接好(hao)機柜電(dian)源(yuan)，并檢(jian)查(cha)儀器(qi)是否(fou)有(you)錯誤(wu)提(ti)示(shi)，如(ru)有(you)提(ti)示(shi)需(xu)先按照儀器(qi)說明把錯誤(wu)提(ti)示(shi)排(pai)除。4)根(gen)據軟件(jian)(jian)操(cao)作設置(zhi)開始測(ce)試(shi)流(liu)程。注意：※在測(ce)試(shi)的過程禁止(zhi)觸摸被(bei)測(ce)物(wu)品。※禁止(zhi)帶(dai)電(dian)拔(ba)插測(ce)試(shi)線的航(hang)空(kong)頭。※如(ru)需(xu)設備(bei)檢(jian)修必須(xu)把電(dian)斷開。本系(xi)統(tong)只提(ti)供自有(you)版(ban)權的導通電(dian)阻實時監控測(ce)試(shi)操(cao)作軟件(jian)(jian)，Windows操(cao)作系(xi)統(tong)、MS-office軟件(jian)(jian)及相關數據庫由客戶(hu)自行購買*該系(xi)統(tong)可根(gen)據客戶(hu)的不同需(xu)求，定制特殊要求以實現更多功能(neng)浙(zhe)江pcb板(ban)電(dian)阻測(ce)試(shi)設備(bei)智能(neng)電(dian)阻能(neng)夠(gou)提(ti)供更加便捷和(he)精確的電(dian)阻測(ce)試(shi)。

表(biao)面絕(jue)緣(yuan)電(dian)(dian)(dian)(dian)阻(zu)（SIR）測(ce)試(shi)是通過(guo)(guo)在(zai)高(gao)溫高(gao)濕的(de)(de)(de)(de)(de)環境中(zhong)持續給予(yu)PCB一定的(de)(de)(de)(de)(de)偏(pian)壓(ya)，經(jing)過(guo)(guo)長時(shi)間(jian)的(de)(de)(de)(de)(de)試(shi)驗(yan)，觀察線路(lu)間(jian)是否有瞬間(jian)短路(lu)或(huo)(huo)出現絕(jue)緣(yuan)失效的(de)(de)(de)(de)(de)緩慢漏(lou)電(dian)(dian)(dian)(dian)情形發生(sheng)。表(biao)面絕(jue)緣(yuan)電(dian)(dian)(dian)(dian)阻(zu)（SIR）測(ce)試(shi)可(ke)以用來(lai)評估金屬導體(ti)之間(jian)短路(lu)或(huo)(huo)者(zhe)電(dian)(dian)(dian)(dian)流泄露造(zao)成的(de)(de)(de)(de)(de)問題，也有助于看(kan)出錫膏中(zhong)的(de)(de)(de)(de)(de)助焊劑或(huo)(huo)其(qi)他(ta)化學物(wu)品在(zai)PCB板面上(shang)是否殘留任何會影響電(dian)(dian)(dian)(dian)子(zi)零件電(dian)(dian)(dian)(dian)氣特性的(de)(de)(de)(de)(de)物(wu)質(zhi)，通過(guo)(guo)表(biao)面絕(jue)緣(yuan)電(dian)(dian)(dian)(dian)阻(zu)（SIR）測(ce)試(shi)數據可(ke)以直接反(fan)映PCB的(de)(de)(de)(de)(de)清潔度(du)。當PCB受(shou)到離(li)(li)子(zi)性物(wu)質(zhi)的(de)(de)(de)(de)(de)污染、或(huo)(huo)含有離(li)(li)子(zi)的(de)(de)(de)(de)(de)物(wu)質(zhi)時(shi)，在(zai)高(gao)溫高(gao)濕狀(zhuang)態下施加電(dian)(dian)(dian)(dian)壓(ya)，電(dian)(dian)(dian)(dian)極(ji)在(zai)電(dian)(dian)(dian)(dian)場和絕(jue)緣(yuan)間(jian)隙存在(zai)水分的(de)(de)(de)(de)(de)共同作用下，離(li)(li)子(zi)化金屬向(xiang)相反(fan)的(de)(de)(de)(de)(de)電(dian)(dian)(dian)(dian)極(ji)間(jian)移動（陰(yin)極(ji)向(xiang)陽(yang)極(ji)轉移），相對的(de)(de)(de)(de)(de)電(dian)(dian)(dian)(dian)極(ji)還原成本(ben)來(lai)的(de)(de)(de)(de)(de)金屬并析出樹枝狀(zhuang)金屬的(de)(de)(de)(de)(de)現象（類(lei)似(si)錫須，容易造(zao)成短路(lu)），這種(zhong)現象稱為離(li)(li)子(zi)遷(qian)移。當存在(zai)這種(zhong)現象時(shi)，表(biao)面絕(jue)緣(yuan)電(dian)(dian)(dian)(dian)阻(zu)（SIR）測(ce)試(shi)可(ke)以通過(guo)(guo)電(dian)(dian)(dian)(dian)阻(zu)值顯現出來(lai)。

離(li)子遷移(yi)(yi)絕(jue)(jue)(jue)緣(yuan)(yuan)(yuan)(yuan)電(dian)(dian)(dian)(dian)(dian)(dian)阻(zu)(zu)測(ce)試(shi)(shi)(shi)(shi)廣泛應用(yong)(yong)于電(dian)(dian)(dian)(dian)(dian)(dian)子產品(pin)制造和(he)質(zhi)量控制過(guo)(guo)程(cheng)中(zhong)。它可以(yi)用(yong)(yong)于檢測(ce)電(dian)(dian)(dian)(dian)(dian)(dian)子元器件(jian)(jian)、印(yin)刷電(dian)(dian)(dian)(dian)(dian)(dian)路板(ban)、電(dian)(dian)(dian)(dian)(dian)(dian)子設備外殼等(deng)材(cai)(cai)料(liao)的(de)質(zhi)量。通過(guo)(guo)測(ce)試(shi)(shi)(shi)(shi)，可以(yi)及時發現(xian)材(cai)(cai)料(liao)中(zhong)的(de)離(li)子遷移(yi)(yi)問題和(he)絕(jue)(jue)(jue)緣(yuan)(yuan)(yuan)(yuan)電(dian)(dian)(dian)(dian)(dian)(dian)阻(zu)(zu)異常(chang)，從而(er)采取相應的(de)措施進行(xing)修復或更換，確保電(dian)(dian)(dian)(dian)(dian)(dian)子產品(pin)的(de)質(zhi)量和(he)可靠性。離(li)子遷移(yi)(yi)絕(jue)(jue)(jue)緣(yuan)(yuan)(yuan)(yuan)電(dian)(dian)(dian)(dian)(dian)(dian)阻(zu)(zu)測(ce)試(shi)(shi)(shi)(shi)的(de)方法主要包括濕度(du)試(shi)(shi)(shi)(shi)驗(yan)、電(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)加(jia)速試(shi)(shi)(shi)(shi)驗(yan)和(he)絕(jue)(jue)(jue)緣(yuan)(yuan)(yuan)(yuan)電(dian)(dian)(dian)(dian)(dian)(dian)阻(zu)(zu)測(ce)量。濕度(du)試(shi)(shi)(shi)(shi)驗(yan)是將材(cai)(cai)料(liao)置于高(gao)濕度(du)環境(jing)中(zhong)，通過(guo)(guo)觀察(cha)離(li)子遷移(yi)(yi)現(xian)象來評(ping)估(gu)(gu)材(cai)(cai)料(liao)的(de)質(zhi)量。電(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)加(jia)速試(shi)(shi)(shi)(shi)驗(yan)是在(zai)高(gao)電(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)條件(jian)(jian)下進行(xing)離(li)子遷移(yi)(yi)測(ce)試(shi)(shi)(shi)(shi)，以(yi)加(jia)速離(li)子遷移(yi)(yi)速率，從而(er)更快(kuai)地(di)評(ping)估(gu)(gu)材(cai)(cai)料(liao)的(de)質(zhi)量。絕(jue)(jue)(jue)緣(yuan)(yuan)(yuan)(yuan)電(dian)(dian)(dian)(dian)(dian)(dian)阻(zu)(zu)測(ce)量是通過(guo)(guo)測(ce)量材(cai)(cai)料(liao)的(de)絕(jue)(jue)(jue)緣(yuan)(yuan)(yuan)(yuan)電(dian)(dian)(dian)(dian)(dian)(dian)阻(zu)(zu)值來評(ping)估(gu)(gu)材(cai)(cai)料(liao)的(de)絕(jue)(jue)(jue)緣(yuan)(yuan)(yuan)(yuan)性能。在(zai)電(dian)(dian)(dian)(dian)(dian)(dian)子設備領域，表面阻(zu)(zu)抗測(ce)試(shi)(shi)(shi)(shi)SIR測(ce)試(shi)(shi)(shi)(shi)被認為是評(ping)估(gu)(gu)用(yong)(yong)戶(hu)線路板(ban)組(zu)裝材(cai)(cai)料(liao)可靠性的(de)有效評(ping)估(gu)(gu)手(shou)段(duan)。

離子遷(qian)移(yi)（ECM/SIR/CAF)的要因分析與解(jie)決(jue)(jue)方案(an)(an)(an)從(cong)材(cai)料(liao)方面：樹(shu)脂(zhi)與玻纖紗(sha)束之(zhi)間結(jie)合力(li)不(bu)足(zu)；解(jie)決(jue)(jue)方案(an)(an)(an)：優(you)化(hua)CCL制作(zuo)(zuo)參數；選擇抗分層的材(cai)料(liao);填充空(kong)洞(dong)或樹(shu)脂(zhi)奶油層不(bu)足(zu)；解(jie)決(jue)(jue)方案(an)(an)(an)：優(you)化(hua)CCL制作(zuo)(zuo)參數；選擇抗分層的材(cai)料(liao);樹(shu)脂(zhi)吸溫性(xing)差；解(jie)決(jue)(jue)方案(an)(an)(an)：膠片與基(ji)板中的硬化(hua)劑由(you)Dicy改為PN以減少(shao)吸水；樹(shu)脂(zhi)與玻纖清潔度差（含離子成份）；解(jie)決(jue)(jue)方案(an)(an)(an)：使用Anti-CAF的材(cai)料(liao)；銅(tong)箔銅(tong)芽(ya)較長(chang)，易(yi)造成離子遷(qian)移(yi)；解(jie)決(jue)(jue)方案(an)(an)(an)：選用Lowprofilecopperfoil；多大在電子設備制造和維(wei)修過程中，電阻(zu)測(ce)試是非常(chang)重(zhong)要的一環(huan)。廣西離子遷(qian)移(yi)電阻(zu)測(ce)試方法

離(li)(li)子(zi)在單(dan)位強度(V/m)電場作用(yong)下的(de)移動(dong)速度稱之(zhi)為離(li)(li)子(zi)遷移率，它是(shi)分辨被測離(li)(li)子(zi)直徑大小(xiao)的(de)一個重要參數(shu)。東莞離(li)(li)子(zi)遷移電阻測試

Sir電(dian)(dian)(dian)(dian)(dian)(dian)阻(zu)(zu)測(ce)(ce)(ce)試(shi)(shi)(shi)可(ke)(ke)以(yi)(yi)應用(yong)(yong)(yong)于各種(zhong)(zhong)不同的(de)(de)電(dian)(dian)(dian)(dian)(dian)(dian)路(lu)(lu)(lu)(lu)(lu)中(zhong)(zhong)(zhong)。無論是簡單(dan)的(de)(de)電(dian)(dian)(dian)(dian)(dian)(dian)路(lu)(lu)(lu)(lu)(lu)還(huan)是復雜的(de)(de)電(dian)(dian)(dian)(dian)(dian)(dian)路(lu)(lu)(lu)(lu)(lu)，都可(ke)(ke)以(yi)(yi)使用(yong)(yong)(yong)Sir電(dian)(dian)(dian)(dian)(dian)(dian)阻(zu)(zu)測(ce)(ce)(ce)試(shi)(shi)(shi)來(lai)測(ce)(ce)(ce)量電(dian)(dian)(dian)(dian)(dian)(dian)阻(zu)(zu)值。這(zhe)種(zhong)(zhong)測(ce)(ce)(ce)試(shi)(shi)(shi)方法(fa)不僅適用(yong)(yong)(yong)于實驗室環境，也(ye)適用(yong)(yong)(yong)于工業生產(chan)中(zhong)(zhong)(zhong)。在工業生產(chan)中(zhong)(zhong)(zhong)，Sir電(dian)(dian)(dian)(dian)(dian)(dian)阻(zu)(zu)測(ce)(ce)(ce)試(shi)(shi)(shi)可(ke)(ke)以(yi)(yi)用(yong)(yong)(yong)來(lai)檢(jian)測(ce)(ce)(ce)電(dian)(dian)(dian)(dian)(dian)(dian)路(lu)(lu)(lu)(lu)(lu)中(zhong)(zhong)(zhong)的(de)(de)故障(zhang)，提高生產(chan)效(xiao)率。除了測(ce)(ce)(ce)量電(dian)(dian)(dian)(dian)(dian)(dian)阻(zu)(zu)值，Sir電(dian)(dian)(dian)(dian)(dian)(dian)阻(zu)(zu)測(ce)(ce)(ce)試(shi)(shi)(shi)還(huan)可(ke)(ke)以(yi)(yi)用(yong)(yong)(yong)來(lai)檢(jian)測(ce)(ce)(ce)電(dian)(dian)(dian)(dian)(dian)(dian)路(lu)(lu)(lu)(lu)(lu)中(zhong)(zhong)(zhong)的(de)(de)其他問題(ti)(ti)。例如，它(ta)可(ke)(ke)以(yi)(yi)用(yong)(yong)(yong)來(lai)檢(jian)測(ce)(ce)(ce)電(dian)(dian)(dian)(dian)(dian)(dian)路(lu)(lu)(lu)(lu)(lu)中(zhong)(zhong)(zhong)的(de)(de)短(duan)路(lu)(lu)(lu)(lu)(lu)和斷(duan)路(lu)(lu)(lu)(lu)(lu)。通(tong)過測(ce)(ce)(ce)量電(dian)(dian)(dian)(dian)(dian)(dian)磁場(chang)的(de)(de)變化，可(ke)(ke)以(yi)(yi)判斷(duan)電(dian)(dian)(dian)(dian)(dian)(dian)路(lu)(lu)(lu)(lu)(lu)中(zhong)(zhong)(zhong)是否(fou)存在短(duan)路(lu)(lu)(lu)(lu)(lu)或斷(duan)路(lu)(lu)(lu)(lu)(lu)問題(ti)(ti)。這(zhe)種(zhong)(zhong)測(ce)(ce)(ce)試(shi)(shi)(shi)方法(fa)可(ke)(ke)以(yi)(yi)幫(bang)助工程師快速定位電(dian)(dian)(dian)(dian)(dian)(dian)路(lu)(lu)(lu)(lu)(lu)中(zhong)(zhong)(zhong)的(de)(de)問題(ti)(ti)，并(bing)進行修復。東莞離子遷移電(dian)(dian)(dian)(dian)(dian)(dian)阻(zu)(zu)測(ce)(ce)(ce)試(shi)(shi)(shi)

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