Zeta電(dian)(dian)(dian)(dian)(dian)勢(shi)電(dian)(dian)(dian)(dian)(dian)位(wei)(wei)(wei)原(yuan)理：1.什么(me)是(shi)(shi)ZETA電(dian)(dian)(dian)(dian)(dian)勢(shi)電(dian)(dian)(dian)(dian)(dian)位(wei)(wei)(wei)：Zeta電(dian)(dian)(dian)(dian)(dian)位(wei)(wei)(wei)（Zetapotential）是(shi)(shi)指(zhi)剪切(qie)面(mian)(ShearPlane)的(de)(de)(de)(de)(de)電(dian)(dian)(dian)(dian)(dian)位(wei)(wei)(wei)，又叫電(dian)(dian)(dian)(dian)(dian)動(dong)(dong)電(dian)(dian)(dian)(dian)(dian)位(wei)(wei)(wei)或電(dian)(dian)(dian)(dian)(dian)動(dong)(dong)電(dian)(dian)(dian)(dian)(dian)勢(shi)（ζ-電(dian)(dian)(dian)(dian)(dian)位(wei)(wei)(wei)或ζ-電(dian)(dian)(dian)(dian)(dian)勢(shi)），是(shi)(shi)表(biao)(biao)征(zheng)膠(jiao)(jiao)(jiao)體分(fen)散(san)系(xi)穩(wen)定(ding)性(xing)(xing)的(de)(de)(de)(de)(de)重要(yao)指(zhi)標(biao)。2.STERN雙電(dian)(dian)(dian)(dian)(dian)子(zi)層：膠(jiao)(jiao)(jiao)核表(biao)(biao)面(mian)擁有一層離子(zi)，稱為(wei)電(dian)(dian)(dian)(dian)(dian)位(wei)(wei)(wei)離子(zi)，電(dian)(dian)(dian)(dian)(dian)位(wei)(wei)(wei)離子(zi)通過(guo)靜(jing)電(dian)(dian)(dian)(dian)(dian)作用(yong)，把溶液中電(dian)(dian)(dian)(dian)(dian)荷相反(fan)的(de)(de)(de)(de)(de)離子(zi)吸引到(dao)膠(jiao)(jiao)(jiao)核周圍，被吸引的(de)(de)(de)(de)(de)離子(zi)稱為(wei)反(fan)離子(zi)，越(yue)(yue)靠(kao)近膠(jiao)(jiao)(jiao)核表(biao)(biao)面(mian)的(de)(de)(de)(de)(de)地方反(fan)離子(zi)越(yue)(yue)密集，相反(fan)，越(yue)(yue)遠(yuan)的(de)(de)(de)(de)(de)地方反(fan)離子(zi)越(yue)(yue)稀疏，他(ta)們的(de)(de)(de)(de)(de)電(dian)(dian)(dian)(dian)(dian)荷總量與電(dian)(dian)(dian)(dian)(dian)位(wei)(wei)(wei)離子(zi)相等并且符號相反(fan)。 因此，整個(ge)膠(jiao)(jiao)(jiao)團是(shi)(shi)處于電(dian)(dian)(dian)(dian)(dian)中性(xing)(xing)狀(zhuang)態，而膠(jiao)(jiao)(jiao)核表(biao)(biao)面(mian)電(dian)(dian)(dian)(dian)(dian)勢(shi)是(shi)(shi)醉高(gao)的(de)(de)(de)(de)(de)，根據(ju)定(ding)義Zeta電(dian)(dian)(dian)(dian)(dian)位(wei)(wei)(wei)即為(wei)膠(jiao)(jiao)(jiao)核表(biao)(biao)面(mian)電(dian)(dian)(dian)(dian)(dian)勢(shi)。3.DLS散(san)射系(xi)統如何測(ce)ZETA電(dian)(dian)(dian)(dian)(dian)位(wei)(wei)(wei)：目前(qian)測(ce)量ZETA電(dian)(dian)(dian)(dian)(dian)位(wei)(wei)(wei)的(de)(de)(de)(de)(de)方法(fa)主要(yao)有電(dian)(dian)(dian)(dian)(dian)泳法(fa)、電(dian)(dian)(dian)(dian)(dian)滲法(fa)、流動(dong)(dong)電(dian)(dian)(dian)(dian)(dian)位(wei)(wei)(wei)法(fa)以(yi)及超聲波(bo)法(fa)。NicompZ3000采用(yong)的(de)(de)(de)(de)(de)是(shi)(shi)主流的(de)(de)(de)(de)(de)電(dian)(dian)(dian)(dian)(dian)泳法(fa)測(ce)試ZETA。大(da)功(gong)率的(de)(de)(de)(de)(de)激光器(qi)可以(yi)對極小的(de)(de)(de)(de)(de)粒(li)子(zi)也能(neng)搜(sou)集到(dao)足夠的(de)(de)(de)(de)(de)散(san)射信號，使(shi)得儀(yi)器(qi)能(neng)夠得到(dao)極小粒(li)子(zi)的(de)(de)(de)(de)(de)粒(li)徑(jing)分(fen)布。進口zeta電(dian)(dian)(dian)(dian)(dian)位(wei)(wei)(wei)及納(na)米粒(li)度儀(yi)廠家

產品優勢(shi)：四、雪崩二極(ji)管(guan)(guan)(APD)高(gao)靈敏(min)度(du)(du)(du)(du)檢(jian)(jian)測(ce)器(qi)(qi)(qi)(qi)（選(xuan)配(pei)）Nicomp380納米粒(li)(li)(li)(li)徑分(fen)析儀可(ke)以(yi)(yi)(yi)裝配(pei)各種大(da)(da)功率的(de)(de)激(ji)(ji)光(guang)發(fa)生器(qi)(qi)(qi)(qi)和(he)雪崩二極(ji)管(guan)(guan)檢(jian)(jian)測(ce)器(qi)(qi)(qi)(qi)（相(xiang)比較傳(chuan)統(tong)的(de)(de)光(guang)電倍增(zeng)(zeng)管(guan)(guan)有3-5倍放大(da)(da)增(zeng)(zeng)益效果）。APD通(tong)常被用于散射(she)發(fa)生不(bu)(bu)(bu)明顯的(de)(de)體(ti)系里(li)來增(zeng)(zeng)加信(xin)噪比和(he)敏(min)感度(du)(du)(du)(du)，如蛋白質、不(bu)(bu)(bu)溶(rong)性膠束(shu)、濃(nong)度(du)(du)(du)(du)極(ji)低的(de)(de)體(ti)系以(yi)(yi)(yi)及(ji)大(da)(da)分(fen)子(zi)(zi)基團，他們的(de)(de)顆粒(li)(li)(li)(li)的(de)(de)一(yi)般濃(nong)度(du)(du)(du)(du)為1mg/mL甚(shen)至更(geng)低，這些顆粒(li)(li)(li)(li)是由對(dui)光(guang)的(de)(de)散射(she)不(bu)(bu)(bu)敏(min)感的(de)(de)原子(zi)(zi)組成。APD外置了一(yi)個大(da)(da)功率激(ji)(ji)光(guang)發(fa)生器(qi)(qi)(qi)(qi)模(mo)塊，在(zai)非常短的(de)(de)時間內就能檢(jian)(jian)測(ce)分(fen)析納米級顆粒(li)(li)(li)(li)的(de)(de)分(fen)布情況。 五、380/MA多(duo)角(jiao)度(du)(du)(du)(du)檢(jian)(jian)測(ce)器(qi)(qi)(qi)(qi)（選(xuan)配(pei)）粒(li)(li)(li)(li)徑大(da)(da)于100nm的(de)(de)顆粒(li)(li)(li)(li)在(zai)激(ji)(ji)光(guang)的(de)(de)照射(she)下不(bu)(bu)(bu)會朝著(zhu)各個方向散射(she)。多(duo)角(jiao)度(du)(du)(du)(du)檢(jian)(jian)測(ce)角(jiao)器(qi)(qi)(qi)(qi)通(tong)過(guo)調節檢(jian)(jian)測(ce)角(jiao)度(du)(du)(du)(du)來增(zeng)(zeng)加粒(li)(li)(li)(li)子(zi)(zi)對(dui)光(guang)的(de)(de)敏(min)感性來測(ce)試某些特(te)殊級別粒(li)(li)(li)(li)子(zi)(zi)。Nicomp380可(ke)以(yi)(yi)(yi)配(pei)備范(fan)圍在(zai)10°-175，步(bu)長0.7°的(de)(de)多(duo)角(jiao)度(du)(du)(du)(du)測(ce)角(jiao)器(qi)(qi)(qi)(qi)，從而使得單一(yi)90°檢(jian)(jian)測(ce)角(jiao)測(ce)試不(bu)(bu)(bu)了的(de)(de)樣品，通(tong)過(guo)調節角(jiao)度(du)(du)(du)(du)進行檢(jian)(jian)測(ce)，改(gai)善(shan)對(dui)大(da)(da)粒(li)(li)(li)(li)子(zi)(zi)多(duo)分(fen)散系粒(li)(li)(li)(li)徑分(fen)析的(de)(de)精確(que)度(du)(du)(du)(du)。挑選(xuan)zeta電位及(ji)納米粒(li)(li)(li)(li)度(du)(du)(du)(du)儀系列同機采用多(duo)普(pu)勒電泳(yong)光(guang)散射(she)原理（Doppler Electrophoretic Light Scattering, DELS）檢(jian)(jian)測(ce)ZETA電位。

小(xiao)知識——光(guang)(guang)(guang)(guang)電(dian)(dian)(dian)(dian)(dian)倍(bei)(bei)(bei)增(zeng)管(guan)（PMT)光(guang)(guang)(guang)(guang)電(dian)(dian)(dian)(dian)(dian)倍(bei)(bei)(bei)增(zeng)管(guan)（Photomultiplier，簡稱PMT），是(shi)(shi)一(yi)(yi)(yi)(yi)種對紫外光(guang)(guang)(guang)(guang)、可見(jian)光(guang)(guang)(guang)(guang)和近紅外光(guang)(guang)(guang)(guang)極(ji)(ji)(ji)其敏感(gan)的(de)(de)(de)(de)特殊真空管(guan)。它(ta)能使進入(ru)(ru)的(de)(de)(de)(de)微弱光(guang)(guang)(guang)(guang)信(xin)號(hao)增(zeng)強至(zhi)原本(ben)的(de)(de)(de)(de)108倍(bei)(bei)(bei)，使光(guang)(guang)(guang)(guang)信(xin)號(hao)能被(bei)測(ce)量。小(xiao)知識——光(guang)(guang)(guang)(guang)電(dian)(dian)(dian)(dian)(dian)二(er)(er)極(ji)(ji)(ji)管(guan)（APD)光(guang)(guang)(guang)(guang)電(dian)(dian)(dian)(dian)(dian)二(er)(er)極(ji)(ji)(ji)管(guan)是(shi)(shi)由玻(bo)璃封裝(zhuang)的(de)(de)(de)(de)真空裝(zhuang)置，其內包含光(guang)(guang)(guang)(guang)電(dian)(dian)(dian)(dian)(dian)陰極(ji)(ji)(ji)(photocathode)，幾個二(er)(er)次(ci)(ci)發(fa)(fa)(fa)射極(ji)(ji)(ji)(dynode)和一(yi)(yi)(yi)(yi)個陽(yang)極(ji)(ji)(ji)。入(ru)(ru)射光(guang)(guang)(guang)(guang)子(zi)撞擊光(guang)(guang)(guang)(guang)電(dian)(dian)(dian)(dian)(dian)陰極(ji)(ji)(ji)，產生(sheng)光(guang)(guang)(guang)(guang)電(dian)(dian)(dian)(dian)(dian)效(xiao)應，產生(sheng)的(de)(de)(de)(de)光(guang)(guang)(guang)(guang)電(dian)(dian)(dian)(dian)(dian)子(zi)被(bei)聚焦(jiao)到(dao)二(er)(er)次(ci)(ci)發(fa)(fa)(fa)射極(ji)(ji)(ji)。其后的(de)(de)(de)(de)工作原理如同電(dian)(dian)(dian)(dian)(dian)子(zi)倍(bei)(bei)(bei)增(zeng)管(guan)，電(dian)(dian)(dian)(dian)(dian)子(zi)被(bei)加速到(dao)二(er)(er)次(ci)(ci)發(fa)(fa)(fa)射極(ji)(ji)(ji)產生(sheng)多個二(er)(er)次(ci)(ci)電(dian)(dian)(dian)(dian)(dian)子(zi)，通(tong)常每個二(er)(er)次(ci)(ci)發(fa)(fa)(fa)射極(ji)(ji)(ji)的(de)(de)(de)(de)電(dian)(dian)(dian)(dian)(dian)位差(cha)在100到(dao)200伏(fu)特。二(er)(er)次(ci)(ci)電(dian)(dian)(dian)(dian)(dian)子(zi)流像瀑布一(yi)(yi)(yi)(yi)般，經過一(yi)(yi)(yi)(yi)連串的(de)(de)(de)(de)二(er)(er)次(ci)(ci)發(fa)(fa)(fa)射極(ji)(ji)(ji)使得電(dian)(dian)(dian)(dian)(dian)子(zi)倍(bei)(bei)(bei)增(zeng)，然后到(dao)達陽(yang)極(ji)(ji)(ji)。一(yi)(yi)(yi)(yi)般光(guang)(guang)(guang)(guang)電(dian)(dian)(dian)(dian)(dian)倍(bei)(bei)(bei)增(zeng)管(guan)的(de)(de)(de)(de)二(er)(er)次(ci)(ci)發(fa)(fa)(fa)射極(ji)(ji)(ji)是(shi)(shi)分離式的(de)(de)(de)(de)，而電(dian)(dian)(dian)(dian)(dian)子(zi)倍(bei)(bei)(bei)增(zeng)管(guan)的(de)(de)(de)(de)二(er)(er)次(ci)(ci)發(fa)(fa)(fa)射極(ji)(ji)(ji)是(shi)(shi)連續式的(de)(de)(de)(de)。

Nicomp380系列(lie)納米(mi)激光(guang)(guang)(guang)粒(li)(li)(li)度(du)(du)(du)儀專為復(fu)雜體系提供高精度(du)(du)(du)粒(li)(li)(li)度(du)(du)(du)解析方案。工作原(yuan)理：粒(li)(li)(li)度(du)(du)(du)分(fen)(fen)(fen)布(bu)：動態光(guang)(guang)(guang)散射(she)儀（Dynamic Light Scattering,DLS）/ZETA電(dian)(dian)位：多普勒電(dian)(dian)泳光(guang)(guang)(guang)散射(she)原(yuan)理（Doppler ElectrophoreticLightScattering,DELS）；檢(jian)測(ce)(ce)范(fan)(fan)圍(wei)：粒(li)(li)(li)徑范(fan)(fan)圍(wei)0.3nm-10.0μm/ZETA電(dian)(dian)位+/-500mV；Nicomp380Z3000系列(lie)納米(mi)激光(guang)(guang)(guang)粒(li)(li)(li)度(du)(du)(du)儀是(shi)在原(yuan)有(you)的(de)經典型號380ZLS&S基礎上升(sheng)級配套而來(lai)，采(cai)用動態光(guang)(guang)(guang)散射(she)（Dynamic Light Scattering,DLS）原(yuan)理檢(jian)測(ce)(ce)分(fen)(fen)(fen)析顆粒(li)(li)(li)的(de)粒(li)(li)(li)度(du)(du)(du)分(fen)(fen)(fen)布(bu)，同機采(cai)用多普勒電(dian)(dian)泳光(guang)(guang)(guang)散射(she)原(yuan)理（Doppler Electrophoretic Light Scattering,DELS）檢(jian)測(ce)(ce)ZETA電(dian)(dian)位。粒(li)(li)(li)徑檢(jian)測(ce)(ce)范(fan)(fan)圍(wei)0.3nm–10μm，ZETA電(dian)(dian)位檢(jian)測(ce)(ce)范(fan)(fan)圍(wei)為+/-500mV。其配套粒(li)(li)(li)度(du)(du)(du)分(fen)(fen)(fen)析軟件復(fu)合采(cai)用了高斯(si)（Gaussian）單峰算法的(de)Nicomp多峰算法，對于多組分(fen)(fen)(fen)、粒(li)(li)(li)徑分(fen)(fen)(fen)布(bu)不均勻分(fen)(fen)(fen)散體系的(de)分(fen)(fen)(fen)析具有(you)獨特優勢(shi)。ZETA電(dian)(dian)位模塊使(shi)用雙(shuang)列(lie)直插式方形樣品池(chi)和鈀(ba)電(dian)(dian)極，一個(ge)電(dian)(dian)極可以使(shi)用成千(qian)上萬次(ci)。另外，采(cai)用可變電(dian)(dian)場適應不同的(de)樣品檢(jian)測(ce)(ce)需求。既保證檢(jian)測(ce)(ce)精度(du)(du)(du)，亦幫用戶節省檢(jian)測(ce)(ce)成本(ben)。ZETA電(dian)(dian)位模塊使(shi)用雙(shuang)列(lie)直插式方形樣品池(chi)和鈀(ba)電(dian)(dian)極，一個(ge)電(dian)(dian)極可以使(shi)用成千(qian)上萬次(ci)。

Nicomp多(duo)(duo)(duo)峰(feng)分(fen)布(bu)(bu)概念：基線(xian)調整自動補償功(gong)能(neng)和高(gao)(gao)分(fen)辨(bian)(bian)率(lv)多(duo)(duo)(duo)峰(feng)算法(fa)是Nicomp380系(xi)(xi)(xi)列(lie)儀(yi)器的(de)(de)(de)(de)(de)(de)兩個主要特點，Nicomp創始人(ren)DaveNicole很(hen)早就認識到(dao)傳統(tong)的(de)(de)(de)(de)(de)(de)動態(tai)光散射理(li)論(lun)只(zhi)給(gei)出高(gao)(gao)斯(si)模式(shi)的(de)(de)(de)(de)(de)(de)粒(li)度(du)分(fen)布(bu)(bu)，這(zhe)和實(shi)踐生(sheng)(sheng)產生(sheng)(sheng)活中(zhong)不相符，因(yin)為現實(shi)中(zhong)很(hen)多(duo)(duo)(duo)樣本是多(duo)(duo)(duo)分(fen)散體系(xi)(xi)(xi)，非單分(fen)散體系(xi)(xi)(xi)，而(er)且高(gao)(gao)斯(si)分(fen)布(bu)(bu)靈敏(min)(min)性不足，分(fen)辨(bian)(bian)率(lv)不高(gao)(gao)，這(zhe)些特點都制約了(le)納(na)米粒(li)度(du)儀(yi)在實(shi)際生(sheng)(sheng)產生(sheng)(sheng)活中(zhong)的(de)(de)(de)(de)(de)(de)使用(yong)。其開創的(de)(de)(de)(de)(de)(de)Nicomp多(duo)(duo)(duo)峰(feng)分(fen)布(bu)(bu)理(li)論(lun)，提高(gao)(gao)了(le)動態(tai)光散射理(li)論(lun)的(de)(de)(de)(de)(de)(de)分(fen)辨(bian)(bian)率(lv)和靈敏(min)(min)性。Nicomp多(duo)(duo)(duo)峰(feng)分(fen)布(bu)(bu)優(you)勢Nicomp系(xi)(xi)(xi)列(lie)儀(yi)器均可(ke)(ke)以(yi)(yi)自由在Gaussian分(fen)布(bu)(bu)模式(shi)和Nicomp多(duo)(duo)(duo)峰(feng)分(fen)布(bu)(bu)模式(shi)中(zhong)切換。其不只(zhi)可(ke)(ke)以(yi)(yi)給(gei)出傳統(tong)的(de)(de)(de)(de)(de)(de)DLS系(xi)(xi)(xi)統(tong)的(de)(de)(de)(de)(de)(de)結果(guo)，更可(ke)(ke)以(yi)(yi)通(tong)過Nicomp多(duo)(duo)(duo)峰(feng)分(fen)布(bu)(bu)模式(shi)體現樣品的(de)(de)(de)(de)(de)(de)真(zhen)實(shi)情況(kuang)。依托于Nicomp系(xi)(xi)(xi)列(lie)儀(yi)器一系(xi)(xi)(xi)列(lie)優(you)異的(de)(de)(de)(de)(de)(de)算法(fa)和高(gao)(gao)靈敏(min)(min)性的(de)(de)(de)(de)(de)(de)硬件設計，Nicomp納(na)米激光粒(li)度(du)儀(yi)可(ke)(ke)以(yi)(yi)有效(xiao)區分(fen)1:2的(de)(de)(de)(de)(de)(de)多(duo)(duo)(duo)分(fen)散體系(xi)(xi)(xi)。四、雪(xue)崩(beng)二極管 (APD)高(gao)(gao)靈敏(min)(min)度(du)檢測(ce)器（選配） ：Nicomp 380裝配各種(zhong)大(da)功(gong)率(lv)的(de)(de)(de)(de)(de)(de)激光發生(sheng)(sheng)器和雪(xue)崩(beng)二極管檢測(ce)器。挑(tiao)選zeta電位及(ji)納(na)米粒(li)度(du)儀(yi)系(xi)(xi)(xi)列(lie)

這和(he)實踐生產生活中不相符(fu)，因為(wei)現實中很多樣本是多分散(san)體(ti)系(xi)，非單分散(san)體(ti)系(xi)。進口zeta電位及納米粒度(du)儀(yi)廠家

動(dong)(dong)態光(guang)(guang)散(san)射理論：粒(li)子(zi)的(de)(de)擴(kuo)散(san)效(xiao)應(ying)：懸浮的(de)(de)粒(li)子(zi)并不(bu)(bu)是(shi)(shi)(shi)靜止不(bu)(bu)動(dong)(dong)的(de)(de)，相(xiang)反(fan)，他們以布朗運動(dong)(dong)（Brownianmotion)的(de)(de)方式無(wu)規則的(de)(de)運動(dong)(dong)，布朗運動(dong)(dong)主(zhu)要是(shi)(shi)(shi)由(you)于(yu)臨近的(de)(de)溶(rong)劑分子(zi)沖撞而(er)(er)引起(qi)的(de)(de)。因此，到達PMT檢(jian)測(ce)區(qu)的(de)(de)每一(yi)束散(san)射光(guang)(guang)隨時間也呈(cheng)無(wu)規則波動(dong)(dong)，這(zhe)是(shi)(shi)(shi)由(you)于(yu)產(chan)生(sheng)散(san)射光(guang)(guang)的(de)(de)粒(li)子(zi)的(de)(de)位(wei)(wei)置不(bu)(bu)同而(er)(er)導致(zhi)的(de)(de)無(wu)規則波動(dong)(dong)。因為這(zhe)些光(guang)(guang)互相(xiang)干涉(she)在(zai)一(yi)起(qi)，在(zai)檢(jian)測(ce)器中(zhong)檢(jian)測(ce)到的(de)(de)光(guang)(guang)強值就(jiu)會隨時間而(er)(er)不(bu)(bu)斷波動(dong)(dong)。粒(li)子(zi)很(hen)小的(de)(de)位(wei)(wei)移需要在(zai)相(xiang)位(wei)(wei)上產(chan)生(sheng)很(hen)大(da)的(de)(de)變化(hua)，進(jin)而(er)(er)產(chan)生(sheng)有(you)實際(ji)意義(yi)的(de)(de)波動(dong)(dong)，于(yu)是(shi)(shi)(shi)這(zhe)些波動(dong)(dong)在(zai)凈(jing)光(guang)(guang)強值上反(fan)應(ying)出來。 DLS測(ce)量粒(li)徑(jing)技術的(de)(de)關鍵物理概念是(shi)(shi)(shi)基(ji)于(yu)粒(li)子(zi)的(de)(de)波動(dong)(dong)時間周期是(shi)(shi)(shi)隨著粒(li)子(zi)的(de)(de)粒(li)徑(jing)大(da)小而(er)(er)變化(hua)的(de)(de)。為了簡化(hua)這(zhe)個概念，我們現在(zai)假定(ding)粒(li)子(zi)是(shi)(shi)(shi)均一(yi)大(da)小的(de)(de)，具有(you)相(xiang)同的(de)(de)擴(kuo)散(san)系(xi)數(shu)（diffusion coefficient)。分散(san)體系(xi)中(zhong)的(de)(de)小粒(li)子(zi)運動(dong)(dong)的(de)(de)快，將會導致(zhi)光(guang)(guang)強波動(dong)(dong)信號(hao)變化(hua)很(hen)快；而(er)(er)相(xiang)反(fan)地，大(da)粒(li)子(zi)擴(kuo)散(san)地畢(bi)竟(jing)慢(man)，導致(zhi)了光(guang)(guang)強值的(de)(de)變化(hua)比較慢(man)。進(jin)口zeta電位(wei)(wei)及納(na)米粒(li)度儀廠家

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